標題: Power and reliability improvement of an electro-thermal microactuator using Ni-diamond nanocomposite
作者: Tsai, LN
Shen, GR
Cheng, YT
Hsu, W
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2004
摘要: Here a low-temperature stress-free electrolytic nickel (EL) deposition process with the addition of uniformly dispersed diamond nanoparticles (diameter < 0.5 mum) is propose to fabricate cantilevers and electro-thermal microactuators to demonstrate the improvement of the device on reducing input power requirement and enhancing operation reliability. The fabrication results show that the nanodiamond particles are successfully dispersed in the electroplating nickel layers. By calibrating the resonant frequencies of nickel cantilevers with different concentrations of diamond nanoparticles, the E/pratio of cantilevers can be enhanced 7.1 times with diamond nanoparticles of 2 g/l in the proposed electrolytic nickel (EL) deposition process. From displacement tests, the electro-thermal microactuator with nanodiamond particles of 2 g/l reduces 73% power requirement of pure nickel device needed at the same output displacement of 3 mum. Also, the reversible displacement range is found to be expanded from 1.8 mum to 3 mum by adding nanodiamond particles of 2 g/l in the nickel electro-thermal microactuators.
URI: http://hdl.handle.net/11536/18234
ISBN: 0-7803-8365-6
ISSN: 0569-5503
期刊: 54TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS
起始頁: 472
結束頁: 476
Appears in Collections:Conferences Paper