Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chang, YA | en_US |
dc.contributor.author | Kuo, HC | en_US |
dc.contributor.author | Chang, YH | en_US |
dc.contributor.author | Wang, SC | en_US |
dc.contributor.author | Laih, LH | en_US |
dc.date.accessioned | 2014-12-08T15:25:53Z | - |
dc.date.available | 2014-12-08T15:25:53Z | - |
dc.date.issued | 2004 | en_US |
dc.identifier.isbn | 0-8194-5583-0 | en_US |
dc.identifier.issn | 0277-786X | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/18328 | - |
dc.identifier.uri | http://dx.doi.org/10.1117/12.577321 | en_US |
dc.description.abstract | In this article, the laser performance of the 1300-nm In0.4Ga0.6As0.986N0.014/GaAs1-xNx quantum well lasers with various GaAs1-xNx strain compensated barriers (x=0%, 0.5%, 1 %, and 2%) have been numerically investigated with a laser technology integrated simulation program. The simulation results suggest that with x=0% and 0.5% can have better optical gain properties and high characteristic temperature coefficient To values of 110 K and 94 K at the temperature range of 300-370 K. As the nitrogen composition in GaAs1-xNx barrier increases more than 1% the laser performance degrades rapidly and the To value decreases to 87 K at temperature range of 300-340 K. This can be attributed to the decrease of conduction band carrier confinement potential between In0.4Ga0.6As0.986N0.014 QW and GaAs1-xNx barrier and the increase of electronic leakage current. Finally, the temperature dependent electronic leakage current in the InGaAsN/GaAs1-xNx quantum-well lasers are also investigated. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | III-V semiconductor | en_US |
dc.subject | InGaAsN | en_US |
dc.subject | strain compensate | en_US |
dc.subject | numerical simulation | en_US |
dc.title | Simulation and analysis of 1300-nm In0.4Ga0.6As0.986N0.014/GaAs1-xNx quantum-well lasers with various GaAs1-xNx strain compensated barriers | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.doi | 10.1117/12.577321 | en_US |
dc.identifier.journal | SEMICONDUCTOR LASERS AND APPLICATIONS II | en_US |
dc.citation.volume | 5628 | en_US |
dc.citation.spage | 40 | en_US |
dc.citation.epage | 48 | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | Department of Photonics | en_US |
dc.identifier.wosnumber | WOS:000227356800007 | - |
Appears in Collections: | Conferences Paper |
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