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dc.contributor.authorMeng, CCen_US
dc.contributor.authorXu, SKen_US
dc.contributor.authorWu, THen_US
dc.contributor.authorChao, MHen_US
dc.contributor.authorHuang, GWen_US
dc.date.accessioned2014-12-08T15:26:09Z-
dc.date.available2014-12-08T15:26:09Z-
dc.date.issued2003en_US
dc.identifier.isbn0-7803-7695-1en_US
dc.identifier.issn0149-645Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/18550-
dc.description.abstractCMOS deep N-well technology can eliminate body effects of NMOS transistors and improve LO-IF and LO-RF isolation in a Gilbert micromixer. A 37 dB LO-IF and 38 dB LO-RF isolation downconversion micromixer with 19 dB conversion gain, IP1dB=-19.5 dBm and IIP3=-12.5 dBm when RF=2.4 GHz and LO=2.25 GHz; is demonstrated in this paper by using 0.18 mum deep N-well CMOS technology. The input return loss and output return loss are better than 15 dB for frequencies up to 6 GHz. On the other hand, a downconversion micromixer without deep n-well has almost identical power performance but achieves only 20 dB LO-IF isolation and 21 dB LO-RF isolation even if two kinds of mixers are fabricated in adjacent areas of the same wafer. The downconversion micromixer used here has intrinsically single-to-differential input stage and active differential PMOS loads to increase IF differential gain while CMFB is used to stabilize bias points. An IF differential amplifier converts differential output into a single-ended output. Finally, an off-chip rat-race coupler provides balanced LO signals to facilitate isolation measurement.en_US
dc.language.isoen_USen_US
dc.titleA high isolation CMFB downconversion micromixer using 0.18-mu m deep N-well CMOS technologyen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3en_US
dc.citation.spageA105en_US
dc.citation.epageA108en_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000184045100174-
Appears in Collections:Conferences Paper