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dc.contributor.authorJiang, TYen_US
dc.contributor.authorLiu, CNJen_US
dc.contributor.authorJou, JYen_US
dc.date.accessioned2014-12-08T15:26:28Z-
dc.date.available2014-12-08T15:26:28Z-
dc.date.issued2002en_US
dc.identifier.isbn0-7695-1825-7en_US
dc.identifier.urihttp://hdl.handle.net/11536/18787-
dc.description.abstractWe propose an effective approach to diagnose multiple design errors in HDL designs with only one erroneous test case. Error candidates will be greatly reduced while ensuring that true erroneous statements are included in, The probability of correctness for each potential erroneous statement will be estimated such that the most suspected statements are reported first. Experiments show that the size of error candidates is indeed small and the estimation for the probability of correctness for potential error candidates is accurate.en_US
dc.language.isoen_USen_US
dc.titleEffective error diagnosis for RTL designs in HDLSen_US
dc.typeProceedings Paperen_US
dc.identifier.journalPROCEEDINGS OF THE 11TH ASIAN TEST SYMPOSIUM (ATS 02)en_US
dc.citation.spage362en_US
dc.citation.epage367en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000179973300061-
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