An efficient test and diagnosis scheme for the feedback type of analog circuits with minimal added circuits

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Lin, JW	en_US
dc.contributor.author	Lee, CL	en_US
dc.contributor.author	Chen, JE	en_US
dc.date.accessioned	2014-12-08T15:26:33Z	-
dc.date.available	2014-12-08T15:26:33Z	-
dc.date.issued	2002	en_US
dc.identifier.isbn	0-7695-1472-3	en_US
dc.identifier.uri	http://hdl.handle.net/11536/18846	-
dc.language.iso	en_US	en_US
dc.title	An efficient test and diagnosis scheme for the feedback type of analog circuits with minimal added circuits	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, 2002 PROCEEDINGS	en_US
dc.citation.spage	1119	en_US
dc.citation.epage	1119	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:000176953300206	-
顯示於類別：	會議論文