標題: Study of spin coating properties of SU-8 thick-layer photoresist
作者: Chen, RH
Cheng, CM
機械工程學系
Department of Mechanical Engineering
關鍵字: thick-layer resist;SU-8;thickness uniformity;spin coating
公開日期: 2001
摘要: In this paper the coating properties including film thickness, thickness uniformity and variation of viscosity of SU8 photoresist were investigated by using a spin coater and rheometer. Experimental results indicate that the coating qualities of SU8 are affected by several factors including the spinning speed, the photoresist viscosity, the initial acceleration and the duration. Some recommendations are presented for increasing the quality of SU8 spin coating in thick-film processing.
URI: http://hdl.handle.net/11536/18963
http://dx.doi.org/10.1117/12.436881
ISBN: 0-8194-4031-0
ISSN: 0277-786X
DOI: 10.1117/12.436881
期刊: ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XVIII, PTS 1 AND 2
Volume: 4345
起始頁: 494
結束頁: 501
Appears in Collections:Conferences Paper


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