Title: | Socillator test: A delay test scheme for embedded ICs in the boundary-scan environment |
Authors: | Tan, TJ Lee, CL 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
Keywords: | delay testing;embedded testing;SOC testing;oscillation test;system test |
Issue Date: | 2001 |
Abstract: | A novel test scheme, which uses an oscillation source to supply the test signal and a transition detector to detect the arrival of the transition of the test signal through the CUT within the specific delay rime, is proposed. The scheme is ideal to test embedded chips in the boundary scan environment within an SOC. |
URI: | http://hdl.handle.net/11536/19041 |
ISBN: | 0-7695-1123-6 |
ISSN: | 1093-0167 |
Journal: | 19TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS |
Begin Page: | 158 |
End Page: | 162 |
Appears in Collections: | Conferences Paper |