標題: The design of automatic-lock-automatic-retrieve single-chip IPM for converter systems
作者: Chang, LK
Tsai, MY
電控工程研究所
Institute of Electrical and Control Engineering
公開日期: 2001
摘要: This paper describes a single-chip intelligent power module (IPM) manufactured by utilizing a modified high voltage BCD process that integrates power devices, LIGBTs, and protection circuits on the SOI substrate. The smart integrated circuits provide automatic-lock-automatic-retrieve sensing and protection functions To give strong and fast protection ability against faults of over-on-state-voltage, over-current, and over-temperature, those are specially designed for power converter usage. When the gate voltage of LIGBT is high and the faulty event is sensed, the protection circuit pulls down the gate voltage to low and toggles LIGBT to off state immediately. However, each time the gate voltage returns to high, LIGBT is retrieved to the normal operating condition automatically. Therefore, the proposed IPM can operate superior in the converters with pulse-width-modulation (PWM) applications.
URI: http://hdl.handle.net/11536/19158
ISBN: 0-7803-6412-0
期刊: 2001 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS, AND APPLICATIONS, PROCEEDINGS OF TECHNICAL PAPERS
起始頁: 236
結束頁: 239
Appears in Collections:Conferences Paper