完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Huang, YC | en_US |
dc.contributor.author | Lee, CL | en_US |
dc.contributor.author | Lin, JW | en_US |
dc.contributor.author | Chen, JE | en_US |
dc.contributor.author | Su, CC | en_US |
dc.date.accessioned | 2014-12-08T15:27:01Z | - |
dc.date.available | 2014-12-08T15:27:01Z | - |
dc.date.issued | 2000 | en_US |
dc.identifier.isbn | 0-7695-0888-X | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/19234 | - |
dc.description.abstract | In this paper, a methodology to develop fault models for hierarchical linear systems which are composed of operational amplifiers(OP) is demonstrated and presented. The methodology, at first, presents a transfer function model for the open-loop OP based on analysis of element faults at the transistor level. Then it derives a transfer function model for the closed loop OP based on the derived open-loop OP level model, again a higher level fault model for a module which is composed of closed loop OPs. The models can handle ac faults. The benchmark state-variable filter is used as an example to demonstrate for this methodology. an application of the derived models to Monte-Carlo simulation to save computation time is also demonstrated. | en_US |
dc.language.iso | en_US | en_US |
dc.title | A methodology for fault model development for hierarchical linear systems | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | PROCEEDINGS OF THE NINTH ASIAN TEST SYMPOSIUM (ATS 2000) | en_US |
dc.citation.spage | 90 | en_US |
dc.citation.epage | 95 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000166979100015 | - |
顯示於類別: | 會議論文 |