完整後設資料紀錄
DC 欄位語言
dc.contributor.authorHuang, YCen_US
dc.contributor.authorLee, CLen_US
dc.contributor.authorLin, JWen_US
dc.contributor.authorChen, JEen_US
dc.contributor.authorSu, CCen_US
dc.date.accessioned2014-12-08T15:27:01Z-
dc.date.available2014-12-08T15:27:01Z-
dc.date.issued2000en_US
dc.identifier.isbn0-7695-0888-Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/19234-
dc.description.abstractIn this paper, a methodology to develop fault models for hierarchical linear systems which are composed of operational amplifiers(OP) is demonstrated and presented. The methodology, at first, presents a transfer function model for the open-loop OP based on analysis of element faults at the transistor level. Then it derives a transfer function model for the closed loop OP based on the derived open-loop OP level model, again a higher level fault model for a module which is composed of closed loop OPs. The models can handle ac faults. The benchmark state-variable filter is used as an example to demonstrate for this methodology. an application of the derived models to Monte-Carlo simulation to save computation time is also demonstrated.en_US
dc.language.isoen_USen_US
dc.titleA methodology for fault model development for hierarchical linear systemsen_US
dc.typeProceedings Paperen_US
dc.identifier.journalPROCEEDINGS OF THE NINTH ASIAN TEST SYMPOSIUM (ATS 2000)en_US
dc.citation.spage90en_US
dc.citation.epage95en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000166979100015-
顯示於類別:會議論文