标题: Fault diagnosis for linear analog circuits
作者: Lin, JW
Lee, CL
Su, CC
Chen, JE
电子工程学系及电子研究所
Department of Electronics Engineering and Institute of Electronics
公开日期: 2000
摘要: This paper presents a novel scheme to diagnose single and double faults for linear analog circuits. The scheme first proposes a simple transformation procedure to transform the tested linear analog circuit into discrete signal flow graph, then constructs "diagnosing evaluators", which model the faulty components, to form a diagnosis configuration to diagnose the faults through digital simulation. This saves much computation time. Furthermore, a simple method to un-power the OP's is also proposed to differentiate equivalent faults. The scheme can diagnose faults in passive components as well as faults in OP's.
URI: http://hdl.handle.net/11536/19325
ISBN: 0-7695-0888-X
期刊: PROCEEDINGS OF THE NINTH ASIAN TEST SYMPOSIUM (ATS 2000)
起始页: 25
结束页: 30
显示于类别:Conferences Paper