标题: | Fault diagnosis for linear analog circuits |
作者: | Lin, JW Lee, CL Su, CC Chen, JE 电子工程学系及电子研究所 Department of Electronics Engineering and Institute of Electronics |
公开日期: | 2000 |
摘要: | This paper presents a novel scheme to diagnose single and double faults for linear analog circuits. The scheme first proposes a simple transformation procedure to transform the tested linear analog circuit into discrete signal flow graph, then constructs "diagnosing evaluators", which model the faulty components, to form a diagnosis configuration to diagnose the faults through digital simulation. This saves much computation time. Furthermore, a simple method to un-power the OP's is also proposed to differentiate equivalent faults. The scheme can diagnose faults in passive components as well as faults in OP's. |
URI: | http://hdl.handle.net/11536/19325 |
ISBN: | 0-7695-0888-X |
期刊: | PROCEEDINGS OF THE NINTH ASIAN TEST SYMPOSIUM (ATS 2000) |
起始页: | 25 |
结束页: | 30 |
显示于类别: | Conferences Paper |