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dc.contributor.authorChan, JLen_US
dc.contributor.authorChung, SSen_US
dc.date.accessioned2014-12-08T15:27:09Z-
dc.date.available2014-12-08T15:27:09Z-
dc.date.issued1999en_US
dc.identifier.isbn0-7803-5012-Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/19388-
dc.identifier.urihttp://dx.doi.org/10.1109/ASPDAC.1999.760009en_US
dc.description.abstractThe switched-current (SI) circuit is a circuit technique which is able to realize analog sampled-data circuits with a standard CMOS technology. Among all the basic SI circuits, the memory cell circuit is the most primitive element. In this work, a practical SI memory cell which employs negative feedback circuitry and glitch reduction technique is first presented. Based on this basic cell, a universal SI integrator is then developed. General first and second order building blocks are subsequently developed for the cascade design of SI filters. These general building blocks can be used to generate all types of first and second order filters. To verify the accuracy of the SI circuits, test filters including a first order low-pass filter, a second order Chebyshev low-pass filter, and a fifth order Chebyshev low-pass filters have been designed and verified with HSPICE. The simulation results of the frequency response characteristics show good agreement with the theoretical results.en_US
dc.language.isoen_USen_US
dc.titleUniversal switched-current integrator blocks for SI filter designen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1109/ASPDAC.1999.760009en_US
dc.identifier.journalPROCEEDINGS OF ASP-DAC '99: ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE 1999en_US
dc.citation.spage261en_US
dc.citation.epage264en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000079494700065-
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