完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Su, DC | en_US |
dc.contributor.author | Chiu, MH | en_US |
dc.contributor.author | Lee, JY | en_US |
dc.date.accessioned | 2014-12-08T15:27:09Z | - |
dc.date.available | 2014-12-08T15:27:09Z | - |
dc.date.issued | 1999 | en_US |
dc.identifier.isbn | 0-8194-3428-0 | en_US |
dc.identifier.issn | 0277-786X | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/19391 | - |
dc.identifier.uri | http://dx.doi.org/10.1117/12.370265 | en_US |
dc.description.abstract | A new method for measuring complex refractive index is presented based on Fresnel's equations and the uses of a lock-in amplifier. A lock-in amplifier is introduced into a common path interferometer to measure the product of the amplitude reflection coefficients of s and p polarizations and their corresponding phase difference of a light beam reflected from a medium with complex refractive index. Then, these data are substituted into the special equations derived from Fresnel's equations, the complex refractive index can be obtained by numerical calculations. The resolution of this method is better than 0.01. It has both merits of a conventional common-path interferometer and a heterodyne interferometer. And its validity is demonstrated. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | complex refractive index | en_US |
dc.subject | heterodyne interferometry | en_US |
dc.title | Complex refractive index measurements based on Fresnel's equations and the uses of a lock-in amplifier | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.doi | 10.1117/12.370265 | en_US |
dc.identifier.journal | THREE-DIMENSIONAL IMAGING, OPTICAL METROLOGY, AND INSPECTION V | en_US |
dc.citation.volume | 3835 | en_US |
dc.citation.spage | 22 | en_US |
dc.citation.epage | 31 | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | Department of Photonics | en_US |
dc.identifier.wosnumber | WOS:000084180700003 | - |
顯示於類別: | 會議論文 |