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dc.contributor.authorSu, DCen_US
dc.contributor.authorChiu, MHen_US
dc.contributor.authorLee, JYen_US
dc.date.accessioned2014-12-08T15:27:09Z-
dc.date.available2014-12-08T15:27:09Z-
dc.date.issued1999en_US
dc.identifier.isbn0-8194-3428-0en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/19391-
dc.identifier.urihttp://dx.doi.org/10.1117/12.370265en_US
dc.description.abstractA new method for measuring complex refractive index is presented based on Fresnel's equations and the uses of a lock-in amplifier. A lock-in amplifier is introduced into a common path interferometer to measure the product of the amplitude reflection coefficients of s and p polarizations and their corresponding phase difference of a light beam reflected from a medium with complex refractive index. Then, these data are substituted into the special equations derived from Fresnel's equations, the complex refractive index can be obtained by numerical calculations. The resolution of this method is better than 0.01. It has both merits of a conventional common-path interferometer and a heterodyne interferometer. And its validity is demonstrated.en_US
dc.language.isoen_USen_US
dc.subjectcomplex refractive indexen_US
dc.subjectheterodyne interferometryen_US
dc.titleComplex refractive index measurements based on Fresnel's equations and the uses of a lock-in amplifieren_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1117/12.370265en_US
dc.identifier.journalTHREE-DIMENSIONAL IMAGING, OPTICAL METROLOGY, AND INSPECTION Ven_US
dc.citation.volume3835en_US
dc.citation.spage22en_US
dc.citation.epage31en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000084180700003-
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