<link rel="stylesheet" href="styles.cf390c6bfbe7555f.css">

A new bride damage characterization technique for evaluating hot carrier reliability of flash memory cell after P/E cycles

Thumbnail Image

Date

1997

Authors




Journal Title

Journal ISSN

Volume Title

Publisher

DOI

Abstract

Description

Keywords

Citation

URI

https://ir.lib.nycu.edu.tw/handle/11536/19676

Collections

會議論文;;Conferences Paper

Endorsement

Review

Supplemented By

Referenced By