Functional test pattern generation for CMOS operational amplifier

Abstract

In this paper, the optimum functional patterns for CMOS operational amplifier are proposed based on an analysis to find the maximum difference between the good circuit and the faulty circuit for a CMOS operational amplifier. The theoretical and simulation results show that the derived test patterns do give the maximum difference at the output even when the circuit has a ''soft'' fault. The results have also been applied to generate test patterns for a programmable gain/loss mixed signal circuit.