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dc.contributor.authorLin, JYen_US
dc.contributor.authorShen, WZen_US
dc.contributor.authorJou, JYen_US
dc.date.accessioned2014-12-08T15:27:36Z-
dc.date.available2014-12-08T15:27:36Z-
dc.date.issued1996en_US
dc.identifier.isbn0-8186-7597-7en_US
dc.identifier.issn1063-6757en_US
dc.identifier.urihttp://hdl.handle.net/11536/19856-
dc.description.abstractIn this paper, we propose power consumption models for complex gates and transmission gates, which are extended from the model of basic gates proposed in [1]. We also describe an accurate power characterization method for CMOS standard cell libraries which accounts for the effects of input slew rare, output loading, and logic state dependencies. The characterization methodology separates the power consumption of a cell into three components, e.g., capacitive feedthrough power, short-circuit power, and dynamic power. For each component, power equation is derived from SPICE simulation results where the netlist is extracted from cell's layout. Experimental results on a set of ISCAS'85 benchmark circuits show that the power estimation based on our power modeling and characterization provides within 7% error of SPICE simulation on average while the CPU time consumed is more than two orders of magnitude less.en_US
dc.language.isoen_USen_US
dc.titleA power modeling and characterization method for the CMOS standard cell libraryen_US
dc.typeProceedings Paperen_US
dc.identifier.journal1996 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN - DIGEST OF TECHNICAL PAPERSen_US
dc.citation.spage400en_US
dc.citation.epage404en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1996BG84Y00059-
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