| 標題: | A SPICE simulation model for field emission triode |
| 作者: | Lu, CW Lee, CL Huang, JM 交大名義發表 電子工程學系及電子研究所 National Chiao Tung University Department of Electronics Engineering and Institute of Electronics |
| 公開日期: | 1996 |
| 摘要: | In this work, a simple but accurate circuit model, which can be incorporated into circuit simulation programs such as SPICE, for field emission triode (FET) is developed. The model is based on the Fowler-Nordheim (F-N) J-E relationship but takes into account the charge distribution on the surface of the tip of the device. A procedure is also developed to extract the parameters of the model. |
| URI: | http://hdl.handle.net/11536/19900 |
| ISBN: | 0-7803-3594-5 |
| 期刊: | IVMC '96 - 9TH INTERNATIONAL VACUUM MICROELECTRONICS CONFERENCE, TECHNICAL DIGEST |
| 起始頁: | 62 |
| 結束頁: | 66 |
| 顯示於類別: | 會議論文 |

