INTEGRATED DIAGNOSIS AND RECONFIGURATION PROCESS FOR DEFECT TOLERANT WSI PROCESSOR ARRAYS

標題:	INTEGRATED DIAGNOSIS AND RECONFIGURATION PROCESS FOR DEFECT TOLERANT WSI PROCESSOR ARRAYS
作者:	WANG, KC LIN, JW 資訊工程學系 Department of Computer Science
公開日期:	1994
URI:	http://hdl.handle.net/11536/20106
ISBN:	0-7803-1849-8
ISSN:	1063-2204
期刊:	INTERNATIONAL CONFERENCE ON WAFER SCALE INTEGRATION: IEEE 1994 PROCEEDINGS SIXTH ANNUAL
起始頁:	198
結束頁:	207
Appears in Collections:	Conferences Paper