完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Strelcov, E. | en_US |
dc.contributor.author | Kim, Y. | en_US |
dc.contributor.author | Yang, J. C. | en_US |
dc.contributor.author | Chu, Y. H. | en_US |
dc.contributor.author | Yu, P. | en_US |
dc.contributor.author | Lu, X. | en_US |
dc.contributor.author | Jesse, S. | en_US |
dc.contributor.author | Kalinin, S. V. | en_US |
dc.date.accessioned | 2014-12-08T15:28:31Z | - |
dc.date.available | 2014-12-08T15:28:31Z | - |
dc.date.issued | 2012-11-05 | en_US |
dc.identifier.issn | 0003-6951 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.4764939 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/20626 | - |
dc.description.abstract | The dependence of field-on and field-off hysteresis loop shape in Piezoresponse Force Microscopy (PFM) on driving voltage, V-ac, is explored. A nontrivial dependence of hysteresis loop parameters on measurement conditions is observed. The strategies to distinguish between paraelectric and ferroelectric states with small coercive bias and separate reversible hysteretic and non-hysteretic behaviors are suggested. Generally, measurement of loop evolution with V-ac is a necessary step to establish the veracity of PFM hysteresis measurements. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4764939] | en_US |
dc.language.iso | en_US | en_US |
dc.title | Role of measurement voltage on hysteresis loop shape in Piezoresponse Force Microscopy | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.4764939 | en_US |
dc.identifier.journal | APPLIED PHYSICS LETTERS | en_US |
dc.citation.volume | 101 | en_US |
dc.citation.issue | 19 | en_US |
dc.citation.epage | en_US | |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000311320100046 | - |
dc.citation.woscount | 2 | - |
顯示於類別: | 期刊論文 |