Skip to main content
Log In
Communities & Collections
All of DSpace
Statistics
Home
學術出版;;Publications
會議論文;;Conferences Paper
Electrical Performances and Quality Investigations of Integrated Bonded Structures and TSVs for 3D Interconnects
Electrical Performances and Quality Investigations of Integrated Bonded Structures and TSVs for 3D Interconnects
Loading...
Date
2012
Authors
Chen, K. N.
Chang, Y. J.
Ko, C. T.
Hsu, S. Y.
Chen, H. Y.
Hsiao, C.
Yu, T. H.
Chen, Y. H.
Lo, W. C.
Journal Title
Journal ISSN
Volume Title
Publisher
DOI
Abstract
Description
Keywords
Citation
URI
https://ir.lib.nycu.edu.tw/handle/11536/20752
Collections
會議論文;;Conferences Paper
Endorsement
Review
Supplemented By
Referenced By
Full item page