標題: | Design and implementation of configurable ESD protection cell for 60-GHz RF circuits in a 65-nm CMOS process |
作者: | Lin, Chun-Yu Chu, Li-Wei Ker, Ming-Dou 交大名義發表 National Chiao Tung University |
公開日期: | 1-八月-2011 |
摘要: | The configurable electrostatic discharge (ESD) protection cells have been implemented in a commercial 65-nm CMOS process for 60-GHz RF applications. The distributed ESD protection scheme was modified to be used in this work. With the consideration of parasitic capacitance from I/O pad, the ESD protection cells have reached the 50-Omega input/output matching to reduce the design complexity for RF circuit designer and to provide suitable ESD protection. Experimental results of these ESD protection cells have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. These ESD protection cells can easily be used for ESD protection design in the 60-GHz RF applications, and accelerate the design cycle. (C) 2011 Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.microrel.2011.03.016 http://hdl.handle.net/11536/20782 |
ISSN: | 0026-2714 |
DOI: | 10.1016/j.microrel.2011.03.016 |
期刊: | MICROELECTRONICS RELIABILITY |
Volume: | 51 |
Issue: | 8 |
起始頁: | 1315 |
結束頁: | 1324 |
顯示於類別: | 期刊論文 |