Foreword for the Special Issue on ESD Technology

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DC Field	Value	Language
dc.contributor.author	Boselli, Gianluca	en_US
dc.contributor.author	Ker, Ming-Dou	en_US
dc.contributor.author	Duvvury, Charvaka	en_US
dc.date.accessioned	2014-12-08T15:28:53Z	-
dc.date.available	2014-12-08T15:28:53Z	-
dc.date.issued	2012-12-01	en_US
dc.identifier.issn	1530-4388	en_US
dc.identifier.uri	http://dx.doi.org/10.1109/TDMR.2012.2225232	en_US
dc.identifier.uri	http://hdl.handle.net/11536/20862	-
dc.language.iso	en_US	en_US
dc.title	Foreword for the Special Issue on ESD Technology	en_US
dc.type	Editorial Material	en_US
dc.identifier.doi	10.1109/TDMR.2012.2225232	en_US
dc.identifier.journal	IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY	en_US
dc.citation.volume	12	en_US
dc.citation.issue	4	en_US
dc.citation.spage	588	en_US
dc.citation.epage	588	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:000312101900002	-
dc.citation.woscount	0	-
Appears in Collections:	Articles

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