完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Boselli, Gianluca | en_US |
dc.contributor.author | Ker, Ming-Dou | en_US |
dc.contributor.author | Duvvury, Charvaka | en_US |
dc.date.accessioned | 2014-12-08T15:28:53Z | - |
dc.date.available | 2014-12-08T15:28:53Z | - |
dc.date.issued | 2012-12-01 | en_US |
dc.identifier.issn | 1530-4388 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/TDMR.2012.2225232 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/20862 | - |
dc.language.iso | en_US | en_US |
dc.title | Foreword for the Special Issue on ESD Technology | en_US |
dc.type | Editorial Material | en_US |
dc.identifier.doi | 10.1109/TDMR.2012.2225232 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | en_US |
dc.citation.volume | 12 | en_US |
dc.citation.issue | 4 | en_US |
dc.citation.spage | 588 | en_US |
dc.citation.epage | 588 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000312101900002 | - |
dc.citation.woscount | 0 | - |
顯示於類別: | 期刊論文 |