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dc.contributor.authorBoselli, Gianlucaen_US
dc.contributor.authorKer, Ming-Douen_US
dc.contributor.authorDuvvury, Charvakaen_US
dc.date.accessioned2014-12-08T15:28:53Z-
dc.date.available2014-12-08T15:28:53Z-
dc.date.issued2012-12-01en_US
dc.identifier.issn1530-4388en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TDMR.2012.2225232en_US
dc.identifier.urihttp://hdl.handle.net/11536/20862-
dc.language.isoen_USen_US
dc.titleForeword for the Special Issue on ESD Technologyen_US
dc.typeEditorial Materialen_US
dc.identifier.doi10.1109/TDMR.2012.2225232en_US
dc.identifier.journalIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITYen_US
dc.citation.volume12en_US
dc.citation.issue4en_US
dc.citation.spage588en_US
dc.citation.epage588en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000312101900002-
dc.citation.woscount0-
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