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dc.contributor.authorBalke, Ninaen_US
dc.contributor.authorTselev, Alexanderen_US
dc.contributor.authorArruda, Thomas M.en_US
dc.contributor.authorJesse, Stephenen_US
dc.contributor.authorChu, Ying-Haoen_US
dc.contributor.authorKalinin, Sergei V.en_US
dc.date.accessioned2014-12-08T15:28:54Z-
dc.date.available2014-12-08T15:28:54Z-
dc.date.issued2012-11-01en_US
dc.identifier.issn1936-0851en_US
dc.identifier.urihttp://dx.doi.org/10.1021/nn3038868en_US
dc.identifier.urihttp://hdl.handle.net/11536/20880-
dc.description.abstractThe functionality of a variety of materials and devices is strongly coupled with electromechanical effects which can be used to characterize their functionality. Of high interest is the investigation of these electromechanical effects on the nanoscale which can be achieved by using scanning probe microscopy. Here, an electrical bias is applied locally to the scanning probe tip, and the mechanical sample response is detected. In some applications with electromechanical phenomena, such as energy storage or for biological samples, a liquid environment is required to provide full functionality and sample stability. However, electromechanical sample characterization has mostly been applied in air or under vacuum due to the difficulties of applying local electric fields in a conductive environment. Here, we present a detailed study of piezoresponse force microscopy of ferroelectric samples in liquid environments as a model system for electromechanical effects in general. The ionic strength of the liquid is varied, and possibilities and limitations of the technique are explored. Numerical simulations are used to explain the observed phenomena and used to suggest strategies to work in liquid environments with high ionic strength.en_US
dc.language.isoen_USen_US
dc.subjectscanning probe microscopyen_US
dc.subjectliquiden_US
dc.subjectferroelectricsen_US
dc.subjectelectromechanicsen_US
dc.subjectpiezoresponse force microscopyen_US
dc.titleProbing Local Electromechanical Effects in Highly Conductive Electrolytesen_US
dc.typeArticleen_US
dc.identifier.doi10.1021/nn3038868en_US
dc.identifier.journalACS NANOen_US
dc.citation.volume6en_US
dc.citation.issue11en_US
dc.citation.spage10139en_US
dc.citation.epage10146en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000311521700087-
dc.citation.woscount1-
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