標題: | Role of measurement voltage on hysteresis loop shape in Piezoresponse Force Microscopy |
作者: | Strelcov, E. Kim, Y. Yang, J. C. Chu, Y. H. Yu, P. Lu, X. Jesse, S. Kalinin, S. V. 材料科學與工程學系 Department of Materials Science and Engineering |
公開日期: | 5-十一月-2012 |
摘要: | The dependence of field-on and field-off hysteresis loop shape in Piezoresponse Force Microscopy (PFM) on driving voltage, V-ac, is explored. A nontrivial dependence of hysteresis loop parameters on measurement conditions is observed. The strategies to distinguish between paraelectric and ferroelectric states with small coercive bias and separate reversible hysteretic and non-hysteretic behaviors are suggested. Generally, measurement of loop evolution with V-ac is a necessary step to establish the veracity of PFM hysteresis measurements. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4764939] |
URI: | http://dx.doi.org/10.1063/1.4764939 http://hdl.handle.net/11536/20626 |
ISSN: | 0003-6951 |
DOI: | 10.1063/1.4764939 |
期刊: | APPLIED PHYSICS LETTERS |
Volume: | 101 |
Issue: | 19 |
結束頁: | |
顯示於類別: | 期刊論文 |