完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lin, Chen-Wei | en_US |
dc.contributor.author | Chen, Hung-Hsin | en_US |
dc.contributor.author | Yang, Hao-Yu | en_US |
dc.contributor.author | Huang, Chin-Yuan | en_US |
dc.contributor.author | Chao, Mango C. -T. | en_US |
dc.contributor.author | Huang, Rei-Fu | en_US |
dc.date.accessioned | 2014-12-08T15:29:08Z | - |
dc.date.available | 2014-12-08T15:29:08Z | - |
dc.date.issued | 2013-03-01 | en_US |
dc.identifier.issn | 0018-9340 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/TC.2011.252 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/21006 | - |
dc.description.abstract | Due to the increasing demand of an extra-low-power system, a great amount of research effort has been spent in the past to develop an effective and economic subthreshold SRAM design. However, the test methods regarding those newly developed subthreshold SRAM designs have not yet been fully discussed. In this paper, we first categorize the subthreshold SRAM designs into three types, study the faulty behavior of open defects and address decoders faults on each type of designs, and then identify the faults which may not be covered by a traditional SRAM test method. We will also discuss the impact of open defects and threshold-voltage mismatch on sense amplifiers under subthreshold operations. A discussion about the temperature at test is also provided. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | SRAM | en_US |
dc.subject | subthreshold | en_US |
dc.subject | sub-Vth | en_US |
dc.subject | testing | en_US |
dc.subject | stability fault | en_US |
dc.subject | open defect | en_US |
dc.title | Fault Models and Test Methods for Subthreshold SRAMs | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TC.2011.252 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON COMPUTERS | en_US |
dc.citation.volume | 62 | en_US |
dc.citation.issue | 3 | en_US |
dc.citation.spage | 468 | en_US |
dc.citation.epage | 481 | en_US |
dc.contributor.department | 交大名義發表 | zh_TW |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | National Chiao Tung University | en_US |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000314391600005 | - |
dc.citation.woscount | 0 | - |
顯示於類別: | 期刊論文 |