標題: Weak antilocalization in topological insulator Bi2Te3 microflakes
作者: Chiu, Shao-Pin
Lin, Juhn-Jong
電子物理學系
物理研究所
Department of Electrophysics
Institute of Physics
公開日期: 16-一月-2013
摘要: We have studied the carrier transport in two topological insulator (TI) Bi2Te3 microflakes between 0.3 and 10 K and under applied backgate voltages (V-BG). Logarithmic temperature dependent resistance corrections due to the two-dimensional electron-electron interaction effect in the presence of weak disorder were observed. The extracted Coulomb screening parameter is negative, which is in accord with the situation of strong spin-orbit scattering as is inherited in the TI materials. In particular, positive magnetoresistances (MRs) in the two-dimensional weak-antilocalization (WAL) effect were measured in low magnetic fields, which can be satisfactorily described by a multichannel-conduction model. Both at low temperatures of T < 1 K and under high positive VBG, signatures of the presence of two coherent conduction channels were observed, as indicated by an increase by a factor of approximate to 2 in the prefactor which characterizes the WAL MR magnitude. Our results are discussed in terms of the (likely) existence of the Dirac fermion surface states, in addition to the bulk states, in the three-dimensional TI Bi2Te3 material. DOI: 10.1103/PhysRevB.87.035122
URI: http://dx.doi.org/10.1103/PhysRevB.87.035122
http://hdl.handle.net/11536/21040
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.87.035122
期刊: PHYSICAL REVIEW B
Volume: 87
Issue: 3
起始頁: 0
結束頁: 0
顯示於類別:期刊論文


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