標題: TRIAD: A Triple Patterning Lithography Aware Detailed Router
作者: Lin, Yen-Hung
Yu, Bei
Pan, David Z.
Li, Yih-Lang
資訊工程學系
Department of Computer Science
公開日期: 2012
摘要: TPL-friendly detailed routers require a systematic approach to detect TPL conflicts. However, the complexity of conflict graph (CG) impedes directly detecting TPL conflicts in CG. This work proposes a token graph-embedded conflict graph (TECG) to facilitate the TPL conflict detection while maintaining high coloring-flexibility. We then develop a TPL aware detailed router (TRIAD) by applying TECG to a gridless router with the TPL stitch generation. Compared to a greedy coloring approach, experimental results indicate that TRIAD generates no conflicts and few stitches with shorter wirelength at the cost of 2.41 x of runtime.
URI: http://hdl.handle.net/11536/21593
ISBN: 978-1-4503-1573-9
期刊: 2012 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD)
起始頁: 123
結束頁: 129
顯示於類別:會議論文