標題: | TRIAD: A Triple Patterning Lithography Aware Detailed Router |
作者: | Lin, Yen-Hung Yu, Bei Pan, David Z. Li, Yih-Lang 資訊工程學系 Department of Computer Science |
公開日期: | 2012 |
摘要: | TPL-friendly detailed routers require a systematic approach to detect TPL conflicts. However, the complexity of conflict graph (CG) impedes directly detecting TPL conflicts in CG. This work proposes a token graph-embedded conflict graph (TECG) to facilitate the TPL conflict detection while maintaining high coloring-flexibility. We then develop a TPL aware detailed router (TRIAD) by applying TECG to a gridless router with the TPL stitch generation. Compared to a greedy coloring approach, experimental results indicate that TRIAD generates no conflicts and few stitches with shorter wirelength at the cost of 2.41 x of runtime. |
URI: | http://hdl.handle.net/11536/21593 |
ISBN: | 978-1-4503-1573-9 |
期刊: | 2012 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD) |
起始頁: | 123 |
結束頁: | 129 |
顯示於類別: | 會議論文 |