完整後設資料紀錄
DC 欄位語言
dc.contributor.authorHsu, Hsiao-Hsuanen_US
dc.contributor.authorChang, Chun-Yenen_US
dc.contributor.authorCheng, Chun-Huen_US
dc.date.accessioned2014-12-08T15:30:17Z-
dc.date.available2014-12-08T15:30:17Z-
dc.date.issued2013-04-01en_US
dc.identifier.issn1862-6254en_US
dc.identifier.urihttp://dx.doi.org/10.1002/pssr.201307047en_US
dc.identifier.urihttp://hdl.handle.net/11536/21688-
dc.description.abstractIn this Letter, we report a low operation voltage and high mobility flexible InGaZnO thin-film transistor (TFT) using room-temperature processed Y2O3/TiO2/Y2O3 gate dielectric. The flexible IGZO TFT showed a low threshold voltage of 0.75 V, a small sub-threshold swing of 137 mV/decade, a good field effect mobility of 32.7 cm(2)/V s, and a large I-on/I-off ratio of 1.7 x 10(6). The low operation voltage, small subthreshold swing and high mobility could be ascribed to the combination of high-kappa TiO2 and large band gap Y2O3, which provide the potential to meet the requirements of low-temperature and low-power portable electronics. (C) 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheimen_US
dc.language.isoen_USen_US
dc.subjectInGaZnOen_US
dc.subjectthin-film transistorsen_US
dc.subjectTiO2en_US
dc.subjectY2O3en_US
dc.titleFlexible InGaZnO thin film transistors using stacked Y2O3/TiO2/Y2O3 gate dielectrics grown at room temperatureen_US
dc.typeArticleen_US
dc.identifier.doi10.1002/pssr.201307047en_US
dc.identifier.journalPHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERSen_US
dc.citation.volume7en_US
dc.citation.issue4en_US
dc.citation.spage285en_US
dc.citation.epage288en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000318071000009-
dc.citation.woscount3-
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