標題: | Enhanced Light Output Power and Growth Mechanism of GaN-Based Light-Emitting Diodes Grown on Cone-Shaped SiO2 Patterned Template |
作者: | Lin, Da-Wei Huang, Jhih-Kai Lee, Chia-Yu Chang, Ruey-Wen Lan, Yu-Pin Lin, Chien-Chung Lee, Kang-Yuan Lin, Chung-Hsiang Lee, Po-Tsung Chi, Gou-Chung Kuo, Hao-Chung 光電系統研究所 光電工程學系 Institute of Photonic System Department of Photonics |
關鍵字: | Epitaxial lateral overgrowth (ELOG);internal quantum efficiency (IQE);light extraction efficiency (LEE);light-emitting diodes (LEDs);nano-imprint lithography (NIL) |
公開日期: | 1-Apr-2013 |
摘要: | In this study, we successfully transferred the patterns of a cone-shaped patterned sapphire substrate (CPSS) into SiO2 layer to fabricate a cone-shaped SiO2 patterned template by using nanoimprint lithography (NIL). The GaN-based light-emitting diodes (LEDs) were grown on this template by metal-organic chemical vapor deposition (MOCVD). The transmission electron microscopy (TEM) images suggest that the stacking faults formed near the cone-shaped SiO2 patterns during the epitaxial lateral overgrowth (ELOG) can effectively suppress the threading dislocations, which results in an enhancement of internal quantum efficiency. The Monte Carlo ray-tracing simulation reveals that the light extraction efficiency of the LED grown on cone-shaped SiO2 patterned template can be enhanced as compared with the LED grown on CPSS. As a result, the light output power of the LED grown on cone-shaped SiO2 patterned template outperformed the LED grown on CPSS. |
URI: | http://dx.doi.org/10.1109/JDT.2012.2230395 http://hdl.handle.net/11536/21722 |
ISSN: | 1551-319X |
DOI: | 10.1109/JDT.2012.2230395 |
期刊: | JOURNAL OF DISPLAY TECHNOLOGY |
Volume: | 9 |
Issue: | 4 |
起始頁: | 285 |
結束頁: | 291 |
Appears in Collections: | Articles |
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