ELECTRICAL CHARACTERIZATION OF ARSENIC-ION-IMPLANTED SEMIINSULATING GAAS BY CURRENT-VOLTAGE MEASUREMENT

标题:	ELECTRICAL CHARACTERIZATION OF ARSENIC-ION-IMPLANTED SEMIINSULATING GAAS BY CURRENT-VOLTAGE MEASUREMENT
作者:	LIN, GR CHEN, WC CHANG, CS PAN, CL 光电工程学系 Department of Photonics
公开日期:	19-十二月-1994
URI:	http://dx.doi.org/10.1063/1.112434 http://hdl.handle.net/11536/2173
ISSN:	0003-6951
DOI:	10.1063/1.112434
期刊:	APPLIED PHYSICS LETTERS
Volume:	65
Issue:	25
起始页:	3272
结束页:	3274
显示于类别：	Articles

APA	LIN, G., CHEN, W., CHANG, C., & PAN, C. (1994). ELECTRICAL CHARACTERIZATION OF ARSENIC-ION-IMPLANTED SEMIINSULATING GAAS BY CURRENT-VOLTAGE MEASUREMENT. WOS:A1994PX64100036.
Bibtex	@article{LIN1994ELECTRICAL, title={ELECTRICAL CHARACTERIZATION OF ARSENIC-ION-IMPLANTED SEMIINSULATING GAAS BY CURRENT-VOLTAGE MEASUREMENT}, author={LIN, GR and CHEN, WC and CHANG, CS and PAN, CL}, journal={WOS:A1994PX64100036}, year={1994}, url={https://ir.lib.nycu.edu.tw/handle/11536/2173?locale=zh_CN}, }