标题: | Adaptive Power Control Technique on Power-Gated Circuitries |
作者: | Hsieh, Wei-Chih Hwang, Wei 电子工程学系及电子研究所 Department of Electronics Engineering and Institute of Electronics |
关键字: | Power control;power gating;switching state determination mechanism |
公开日期: | 1-七月-2011 |
摘要: | An adaptive power control (APC) system on power-gated circuitries is proposed. The core technique is a switching state determination mechanism as an alternative of critical path replicas. It is intrinsically tolerant of process, voltage, and temperature (PVT) variations because it directly monitors the behavior of VDDV node. The APC system includes a multi-mode power gating network, a voltage sensor, a variable threshold comparator, a slack detection block, and a bank of bidirectional shift registers. By dynamically configuring the size of power gating devices, an average of 56.5% unused slack resulted from worst case margins or input pattern change can be further utilized. A 32-64 bit multiply-accumulate (MAC) unit is fabricated using UMC 90-nm standard process CMOS technology as a test vehicle. The measurement results of test chips exhibit an average of 12.39% net power reduction. A 7.96 x leakage reduction is reported by power gating the MAC unit. For the 32-bit multiplier of MAC, the area and power overhead of proposed APC system are 5% and 1.08%, respectively. Most of the overhead is contributed by power gating devices and their control signal buffers. |
URI: | http://dx.doi.org/10.1109/TVLSI.2010.2048587 http://hdl.handle.net/11536/22176 |
ISSN: | 1063-8210 |
DOI: | 10.1109/TVLSI.2010.2048587 |
期刊: | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS |
Volume: | 19 |
Issue: | 7 |
起始页: | 1167 |
结束页: | 1180 |
显示于类别: | Articles |
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