标题: Adaptive Power Control Technique on Power-Gated Circuitries
作者: Hsieh, Wei-Chih
Hwang, Wei
电子工程学系及电子研究所
Department of Electronics Engineering and Institute of Electronics
关键字: Power control;power gating;switching state determination mechanism
公开日期: 1-七月-2011
摘要: An adaptive power control (APC) system on power-gated circuitries is proposed. The core technique is a switching state determination mechanism as an alternative of critical path replicas. It is intrinsically tolerant of process, voltage, and temperature (PVT) variations because it directly monitors the behavior of VDDV node. The APC system includes a multi-mode power gating network, a voltage sensor, a variable threshold comparator, a slack detection block, and a bank of bidirectional shift registers. By dynamically configuring the size of power gating devices, an average of 56.5% unused slack resulted from worst case margins or input pattern change can be further utilized. A 32-64 bit multiply-accumulate (MAC) unit is fabricated using UMC 90-nm standard process CMOS technology as a test vehicle. The measurement results of test chips exhibit an average of 12.39% net power reduction. A 7.96 x leakage reduction is reported by power gating the MAC unit. For the 32-bit multiplier of MAC, the area and power overhead of proposed APC system are 5% and 1.08%, respectively. Most of the overhead is contributed by power gating devices and their control signal buffers.
URI: http://dx.doi.org/10.1109/TVLSI.2010.2048587
http://hdl.handle.net/11536/22176
ISSN: 1063-8210
DOI: 10.1109/TVLSI.2010.2048587
期刊: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
Volume: 19
Issue: 7
起始页: 1167
结束页: 1180
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