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dc.contributor.authorLu, Chao-Hungen_US
dc.contributor.authorChen, Hung-Mingen_US
dc.contributor.authorLiu, Chien-Nan Jimmyen_US
dc.contributor.authorShih, Wen-Yuen_US
dc.date.accessioned2014-12-08T15:31:26Z-
dc.date.available2014-12-08T15:31:26Z-
dc.date.issued2013-06-01en_US
dc.identifier.issn0167-9260en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.vlsi.2012.05.001en_US
dc.identifier.urihttp://hdl.handle.net/11536/22339-
dc.description.abstractDue to the increasing complexity of the design interactions between the chip and package, it is necessary to consider them at the same time. In order to simultaneously handle chip and package performances, co-design of chip and package is a widely adopted solution, particularly because the finger/pad locations significantly affect IR-drop of the core and the package routing. In this paper, we develop chip-package co-design techniques to determine the locations of the fingers/pads for package routability and signal integrity concerns in IC designs, this method can be used in the 2-D and stacking IC design. Our finger/pad assignment is a two-step method: we first solve the wire congestion problem in package routing, and then try to minimize the IR-drop violation and the length of the bonding wires under a compact IR-drop model. The experimental results are encouraging. Compared with the randomly optimized method, on average, our approaches reduce the maximum package density by 42% and 68% for both technologies, IR-drop by 10.61% and 4.58%; and the bonding wires is reduced by 15.66% if we use stacking chips. (c) 2012 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectPackage routabilityen_US
dc.subjectIR-drop awarenessen_US
dc.subjectPad planningen_US
dc.titlePackage routability- and IR-drop-aware finger/pad planning for single chip and stacking IC designsen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.vlsi.2012.05.001en_US
dc.identifier.journalINTEGRATION-THE VLSI JOURNALen_US
dc.citation.volume46en_US
dc.citation.issue3en_US
dc.citation.spage280en_US
dc.citation.epage289en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000320211800008-
dc.citation.woscount0-
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