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dc.contributor.authorHsu, Hsiao-Hsuanen_US
dc.contributor.authorChang, Chun-Yenen_US
dc.contributor.authorCheng, Chun-Huen_US
dc.date.accessioned2014-12-08T15:31:53Z-
dc.date.available2014-12-08T15:31:53Z-
dc.date.issued2013-09-01en_US
dc.identifier.issn1567-1739en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.cap.2013.04.026en_US
dc.identifier.urihttp://hdl.handle.net/11536/22519-
dc.description.abstractWe report a room-temperature and high-mobility InGaZnO thin-film transistor on flexible substrate. To gain both high gate capacitance and low leakage current, we adopt stacked dielectric of Y2O3/TiO2/Y2O3. This flexible IGZO TFT shows a low threshold voltage of 0.45 V, a small sub-threshold swing of 0.16 V/decade and very high field-effect mobility of 40 cm(2)/V. Such good performance is mainly contributed by improved gate stack structure and thickness modulation of IGZO channel that reduce the interface trap density without apparent mobility degradation. (C) 2013 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectInGaZnO (IGZO)en_US
dc.subjectThin film transistor (TFT)en_US
dc.subjectY2O3en_US
dc.subjectTiO2en_US
dc.titleRoom-temperature flexible thin film transistor with high mobilityen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.cap.2013.04.026en_US
dc.identifier.journalCURRENT APPLIED PHYSICSen_US
dc.citation.volume13en_US
dc.citation.issue7en_US
dc.citation.spage1459en_US
dc.citation.epage1462en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000322631400053-
dc.citation.woscount3-
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