Title: | Flexible InGaZnO thin film transistors using stacked Y2O3/TiO2/Y2O3 gate dielectrics grown at room temperature |
Authors: | Hsu, Hsiao-Hsuan Chang, Chun-Yen Cheng, Chun-Hu 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
Keywords: | InGaZnO;thin-film transistors;TiO2;Y2O3 |
Issue Date: | 1-Apr-2013 |
Abstract: | In this Letter, we report a low operation voltage and high mobility flexible InGaZnO thin-film transistor (TFT) using room-temperature processed Y2O3/TiO2/Y2O3 gate dielectric. The flexible IGZO TFT showed a low threshold voltage of 0.75 V, a small sub-threshold swing of 137 mV/decade, a good field effect mobility of 32.7 cm(2)/V s, and a large I-on/I-off ratio of 1.7 x 10(6). The low operation voltage, small subthreshold swing and high mobility could be ascribed to the combination of high-kappa TiO2 and large band gap Y2O3, which provide the potential to meet the requirements of low-temperature and low-power portable electronics. (C) 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim |
URI: | http://dx.doi.org/10.1002/pssr.201307047 http://hdl.handle.net/11536/21688 |
ISSN: | 1862-6254 |
DOI: | 10.1002/pssr.201307047 |
Journal: | PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS |
Volume: | 7 |
Issue: | 4 |
Begin Page: | 285 |
End Page: | 288 |
Appears in Collections: | Articles |