Atomically Resolved Mapping of Polarization and Electric Fields Across Ferroelectric/Oxide Interfaces by Z-contrast Imaging

標題:	Atomically Resolved Mapping of Polarization and Electric Fields Across Ferroelectric/Oxide Interfaces by Z-contrast Imaging
作者:	Chang, Hye Jung Kalinin, Sergei V. Morozovska, Anna N. Huijben, Mark Chu, Ying-Hao Yu, Pu Ramesh, Ramamoorthy Eliseev, Evgeny A. Svechnikov, George S. Pennycook, Stephen J. Borisevich, Albina Y. 材料科學與工程學系 Department of Materials Science and Engineering
公開日期:	3-六月-2011
摘要:	Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy (STEM) (a-STEM image, b-corresponding displacement profile) is combined with the Landau-Ginsburg-Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions.
URI:	http://dx.doi.org/10.1002/adma.201004641 http://hdl.handle.net/11536/22769
ISSN:	0935-9648
DOI:	10.1002/adma.201004641
期刊:	ADVANCED MATERIALS
Volume:	23
Issue:	21
起始頁:	2474
結束頁:	+
顯示於類別：	期刊論文

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