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dc.contributor.authorHuang, Hsuan-Mingen_US
dc.contributor.authorWen, Charles H. -P.en_US
dc.date.accessioned2014-12-08T15:32:42Z-
dc.date.available2014-12-08T15:32:42Z-
dc.date.issued2013-03-01en_US
dc.identifier.issn2168-2356en_US
dc.identifier.urihttp://dx.doi.org/10.1109/MDT.2012.2194471en_US
dc.identifier.urihttp://hdl.handle.net/11536/22833-
dc.language.isoen_USen_US
dc.titleFast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge Collectionen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/MDT.2012.2194471en_US
dc.identifier.journalIEEE DESIGN & TESTen_US
dc.citation.volume30en_US
dc.citation.issue2en_US
dc.citation.spage77en_US
dc.citation.epage86en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department傳播研究所zh_TW
dc.contributor.department電機資訊學士班zh_TW
dc.contributor.department電機工程學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentInstitute of Communication Studiesen_US
dc.contributor.departmentUndergraduate Honors Program of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000325497800010-
dc.citation.woscount2-
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