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dc.contributor.authorKuo, Jack J. -Y.en_US
dc.contributor.authorFan, Ming-Longen_US
dc.contributor.authorLee, Weien_US
dc.contributor.authorSu, Pinen_US
dc.date.accessioned2014-12-08T15:32:43Z-
dc.date.available2014-12-08T15:32:43Z-
dc.date.issued2013en_US
dc.identifier.isbn978-1-4673-3082-4en_US
dc.identifier.issn1524-766Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/22856-
dc.language.isoen_USen_US
dc.titleSource/Drain Series Resistance Induced Feedback Effect on Drain Current Mismatch and Its Implicationen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2013 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS, AND APPLICATIONS (VLSI-TSA)en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000326324800064-
Appears in Collections:Conferences Paper