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dc.contributor.authorLEE, THen_US
dc.contributor.authorCHOU, JJen_US
dc.date.accessioned2014-12-08T15:03:45Z-
dc.date.available2014-12-08T15:03:45Z-
dc.date.issued1994-10-01en_US
dc.identifier.issn1063-6692en_US
dc.identifier.urihttp://dx.doi.org/10.1109/90.336322en_US
dc.identifier.urihttp://hdl.handle.net/11536/2304-
dc.description.abstractBitonic sorters have recently been proposed to construct along with banyan networks the switching fabric of future broadband networks [2]. Unfortunately, a single fault in a bitonic sorter may have disastrous consequences for the switching system. Therefore, a bitonic sorter must be proved to be free of faults before it can be used. In this paper we study the topological properties of bitonic sorters and present an efficient fault diagnosis procedure to detect, locate, and identify the fault type of single faults. Our diagnosis procedure can detect most single faults in two tests. Faults which cannot be detected in two tests can always be detected in four tests. Several binary search techniques are developed to locate a faulty sorting element (i.e,, a 2 x 2 sorter).en_US
dc.language.isoen_USen_US
dc.titleDIAGNOSIS OF SINGLE FAULTS IN BITONIC SORTERSen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/90.336322en_US
dc.identifier.journalIEEE-ACM TRANSACTIONS ON NETWORKINGen_US
dc.citation.volume2en_US
dc.citation.issue5en_US
dc.citation.spage497en_US
dc.citation.epage507en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:A1994QA78200007-
dc.citation.woscount2-
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