Full metadata record
DC FieldValueLanguage
dc.contributor.authorPeng, An-Samen_US
dc.contributor.authorCho, Ming-Hsiangen_US
dc.contributor.authorWang, Yueh-Huaen_US
dc.contributor.authorWang, Meng-Fangen_US
dc.contributor.authorChen, Daviden_US
dc.contributor.authorWu, Lin-Kunen_US
dc.date.accessioned2014-12-08T15:33:44Z-
dc.date.available2014-12-08T15:33:44Z-
dc.date.issued2013-10-01en_US
dc.identifier.issn0916-8524en_US
dc.identifier.urihttp://dx.doi.org/10.1587/transele.E96.C.1289en_US
dc.identifier.urihttp://hdl.handle.net/11536/23316-
dc.description.abstractIn this paper, a novel and simple one-port de-embedding technique has been applied to through-silicon-via (TSV) characterization and modeling. This method utilized pad, via, and line structures to extract the equivalent circuit model of TSV. The main advantage of this de-embedding method is that it can reduce the chip area to fabricate test element groups (TEGs) for measurements while keeping S-parameter measurement accuracies. We also analyzed the electrical characteristics of substrate coupling and TSV equivalent impedance. Our results shows good agreements between measurement data and the equivalent circuit model up to 20 GHz.en_US
dc.language.isoen_USen_US
dc.subject3D ICen_US
dc.subjectTSVen_US
dc.subjectde-embeddingen_US
dc.subjectTEGsen_US
dc.subjectmicrowaveen_US
dc.subjectRF modelingen_US
dc.titleThrough-Silicon-Via Characterization and Modeling Using a Novel One-Port De-Embedding Techniqueen_US
dc.typeArticleen_US
dc.identifier.doi10.1587/transele.E96.C.1289en_US
dc.identifier.journalIEICE TRANSACTIONS ON ELECTRONICSen_US
dc.citation.volumeE96Cen_US
dc.citation.issue10en_US
dc.citation.spage1289en_US
dc.citation.epage1293en_US
dc.contributor.department電機工程學系zh_TW
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000326667800011-
dc.citation.woscount0-
Appears in Collections:Articles


Files in This Item:

  1. 000326667800011.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.