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dc.contributor.authorIslamov, D. R.en_US
dc.contributor.authorGritsenko, V. A.en_US
dc.contributor.authorCheng, C. H.en_US
dc.contributor.authorChin, A.en_US
dc.date.accessioned2014-12-08T15:34:04Z-
dc.date.available2014-12-08T15:34:04Z-
dc.date.issued2013-12-02en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.4838297en_US
dc.identifier.urihttp://hdl.handle.net/11536/23420-
dc.description.abstractInformation regarding the conductivity type of Si/GeOx/Ni structures with various stoichiometry has been obtained using experiments on injection of minority carriers from n- and p-type silicon. Results show that non-stoichiometric GeOx films exhibit bipolar conductivity, that is, holes as well as electrons contribute to the charge transport. Stoichiometric GeO2 films exhibit unipolar electron conductivity. (C) 2013 AIP Publishing LLC.en_US
dc.language.isoen_USen_US
dc.titleEvolution of the conductivity type in germania by varying the stoichiometryen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.4838297en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume103en_US
dc.citation.issue23en_US
dc.citation.epageen_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000328634900065-
dc.citation.woscount0-
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