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dc.contributor.authorLin, Long-Yien_US
dc.contributor.authorHong, Hao-Chiaoen_US
dc.date.accessioned2014-12-08T15:34:21Z-
dc.date.available2014-12-08T15:34:21Z-
dc.date.issued2013en_US
dc.identifier.issn1081-7735en_US
dc.identifier.urihttp://hdl.handle.net/11536/23524-
dc.identifier.urihttp://dx.doi.org/10.1109/ATS.2013.20en_US
dc.description.abstractThis paper presents the design of a fully-differential low-pass SC biquad filter that allows injecting the parametric and catastrophic faults to it. The design is for the verification of the static linear behavior (SLB) fault model which covers multiple parametric and catastrophic analog faults of sampled-data systems. The SLB fault model assumes that a circuit under test (CUT) has a fixed z-domain transfer function (TF) template and the faults alter nothing but the coefficients of the TF. To verify this basic assumption, we first retrieve all coefficients of the TF of the fault-injected biquad from the test results of a three-tone test following the diagnosis-after-test (DAT) procedure. Then, we conduct simulations with other stimulus tones and check if the tested responses fit in those predicted by the retrieved TF. Experimental results verify that the fixed TF template assumption holds for all the faults that we injected.en_US
dc.language.isoen_USen_US
dc.titleDesign of a Fault-Injectable Fleischer-Laker Switched-Capacitor Biquad for verifying the Static Linear Behavior Fault Modelen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1109/ATS.2013.20en_US
dc.identifier.journal2013 22ND ASIAN TEST SYMPOSIUM (ATS)en_US
dc.citation.spage62en_US
dc.citation.epage66en_US
dc.contributor.department電機資訊學士班zh_TW
dc.contributor.departmentUndergraduate Honors Program of Electrical Engineering and Computer Scienceen_US
dc.identifier.wosnumberWOS:000330230800012-
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