| 標題: | Critical point defect detection for small-pixel thin-film transistor array applied to medical display |
| 作者: | Wang, Yao-Chin Lin, Bor-Shyh 光電系統研究所 影像與生醫光電研究所 生醫電子轉譯研究中心 Institute of Photonic System Institute of Imaging and Biomedical Photonics Biomedical Electronics Translational Research Center |
| 公開日期: | 1-Sep-2013 |
| URI: | http://dx.doi.org/10.1002/jsid.195 http://hdl.handle.net/11536/23727 |
| ISSN: | 1071-0922 |
| DOI: | 10.1002/jsid.195 |
| 期刊: | JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY |
| Volume: | 21 |
| Issue: | 9 |
| 起始頁: | 376 |
| 結束頁: | 380 |
| Appears in Collections: | Articles |
- An Optomechatronics Inspection Technique of TFT Array Flaw Applied to Medical Display / Wang, Yao-Chin;Lin, Bor-Shyh
- Flaw detection and measurement for 4K Ultra HD thin-film-transistor array panel / Wang, Yao-Chin;Lin, Bor-Shyh;Yang, Kei-Hsiung
- Flaw detection and measurement for mobile display / Wang, Yao-Chin;Lin, Bor-Shyh
- Small-pixel TFT flaw detection and measurement using voltage imaging technique / Wang, Yao-Chin;Lin, Bor-Shyh
- Auto Defect Detection of A-IGZO Thin Film Transistor Backplane on Foldable Medical Array Panel Application / Hung, Yu-Min;Wang, Yao-Chin;Yang, Yu-Ching;Lin, Bor-Shyh;Lin, Bor-Shing
- In-process functional testing of pixel circuit in AM-OLEDs / Lin, YC;Shieh, HPD
Loading...