标题: | Flaw detection and measurement for 4K Ultra HD thin-film-transistor array panel |
作者: | Wang, Yao-Chin Lin, Bor-Shyh Yang, Kei-Hsiung 光电系统研究所 影像与生医光电研究所 Institute of Photonic System Institute of Imaging and Biomedical Photonics |
关键字: | Flaw detection;Measurement;4K Ultra HD;TFT array panel |
公开日期: | 1-五月-2014 |
摘要: | Display pixels of liquid-crystal-display televisions (LCD TVs) on thin-film-transistor (TFT) array are getting smaller. This paper introduced the method of voltage imaging technique, which developed and provides initial insight into the thin-film-transistor array flaw detection and measurement for ultra-high-definition (Ultra HD, UHD) LCD TV application. We proposed the measurement of flaw detection, based on TFT array testing and characterization with respect to opto-electric transformation measurement. (C) 2014 Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.measurement.2014.02.022 http://hdl.handle.net/11536/24206 |
ISSN: | 0263-2241 |
DOI: | 10.1016/j.measurement.2014.02.022 |
期刊: | MEASUREMENT |
Volume: | 51 |
Issue: | |
起始页: | 236 |
结束页: | 240 |
显示于类别: | Articles |
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