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dc.contributor.authorChen, Y. C.en_US
dc.contributor.authorHsiao, F. C.en_US
dc.contributor.authorWu, Y. S.en_US
dc.date.accessioned2014-12-08T15:36:12Z-
dc.date.available2014-12-08T15:36:12Z-
dc.date.issued2013en_US
dc.identifier.isbn978-1-60768-430-5en_US
dc.identifier.issn1938-5862en_US
dc.identifier.urihttp://hdl.handle.net/11536/24554-
dc.identifier.urihttp://dx.doi.org/10.1149/05042.0027ecsten_US
dc.description.abstractCurrently, the wet etching patterned sapphire substrate (PSS) has attracted much attention for its high production yield. After etching in hot mixed H2SO4 and H3PO4 solution, the several etched facets were exposed on sapphire substrate. In this study, a series of etching process was used to investigate the formation. As shown in Fig. 1, when SiO2 mask still remained, the structure of PSS comprised of six facets {3 (4) over bar 17}. When SiO2 mask were etched away, beside six facets, there were three extra facets {1 (1) over bar 05} exposed on the top.en_US
dc.language.isoen_USen_US
dc.titleThe Formation of The Hexagonal Pyramid Facets on Wet Etching Patterned Sapphire Substrateen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1149/05042.0027ecsten_US
dc.identifier.journalMATERIALS FOR SOLID STATE LIGHTINGen_US
dc.citation.volume50en_US
dc.citation.issue42en_US
dc.citation.spage27en_US
dc.citation.epage31en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000338315700004-
Appears in Collections:Conferences Paper


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