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dc.contributor.authorChiu, Yi-Weien_US
dc.contributor.authorHu, Yu-Haoen_US
dc.contributor.authorTu, Ming-Hsienen_US
dc.contributor.authorZhao, Jun-Kaien_US
dc.contributor.authorJou, Shyh-Jyeen_US
dc.contributor.authorChuang, Ching-Teen_US
dc.date.accessioned2014-12-08T15:36:13Z-
dc.date.available2014-12-08T15:36:13Z-
dc.date.issued2013en_US
dc.identifier.isbn978-1-4799-1234-6; 978-1-4799-1235-3en_US
dc.identifier.urihttp://hdl.handle.net/11536/24559-
dc.description.abstractThis paper presents a new bit-interleaving 11T subthreshold SRAM cell with Data-Aware Power-Cutoff (DAPC) Write-assist to mitigate the leakage and variation and improve the Write-ability in deep sub-100nm technology. Measurement results from a 4 Kb test chip implemented in 40 nm General Purpose (40GP) CMOS technology operates for V-DD down to 0.32 V (similar to 0.69X of threshold voltage) with V-DDMIN limited by Read operation. The measured maximum operation frequency is 3.5 MHz (16.5 MHz) at 0.32 V (0.38 V) with total power consumption of 15.2 mu W (27.2 mu W) at 25 degrees C.en_US
dc.language.isoen_USen_US
dc.titleA 40 nm 0.32 V 3.5 MHz 11T Single-Ended Bit-Interleaving Subthreshold SRAM with Data-Aware Write-Assisten_US
dc.typeProceedings Paperen_US
dc.identifier.journal2013 IEEE INTERNATIONAL SYMPOSIUM ON LOW POWER ELECTRONICS AND DESIGN (ISLPED)en_US
dc.citation.spage51en_US
dc.citation.epage56en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000337238700009-
Appears in Collections:Conferences Paper