完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chiu, Yi-Wei | en_US |
dc.contributor.author | Hu, Yu-Hao | en_US |
dc.contributor.author | Tu, Ming-Hsien | en_US |
dc.contributor.author | Zhao, Jun-Kai | en_US |
dc.contributor.author | Jou, Shyh-Jye | en_US |
dc.contributor.author | Chuang, Ching-Te | en_US |
dc.date.accessioned | 2014-12-08T15:36:13Z | - |
dc.date.available | 2014-12-08T15:36:13Z | - |
dc.date.issued | 2013 | en_US |
dc.identifier.isbn | 978-1-4799-1234-6; 978-1-4799-1235-3 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/24559 | - |
dc.description.abstract | This paper presents a new bit-interleaving 11T subthreshold SRAM cell with Data-Aware Power-Cutoff (DAPC) Write-assist to mitigate the leakage and variation and improve the Write-ability in deep sub-100nm technology. Measurement results from a 4 Kb test chip implemented in 40 nm General Purpose (40GP) CMOS technology operates for V-DD down to 0.32 V (similar to 0.69X of threshold voltage) with V-DDMIN limited by Read operation. The measured maximum operation frequency is 3.5 MHz (16.5 MHz) at 0.32 V (0.38 V) with total power consumption of 15.2 mu W (27.2 mu W) at 25 degrees C. | en_US |
dc.language.iso | en_US | en_US |
dc.title | A 40 nm 0.32 V 3.5 MHz 11T Single-Ended Bit-Interleaving Subthreshold SRAM with Data-Aware Write-Assist | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2013 IEEE INTERNATIONAL SYMPOSIUM ON LOW POWER ELECTRONICS AND DESIGN (ISLPED) | en_US |
dc.citation.spage | 51 | en_US |
dc.citation.epage | 56 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000337238700009 | - |
顯示於類別: | 會議論文 |