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dc.contributor.authorChang, YAen_US
dc.contributor.authorLai, FIen_US
dc.contributor.authorYu, HCen_US
dc.contributor.authorKuo, HCen_US
dc.contributor.authorLaih, LWen_US
dc.contributor.authorYu, CLen_US
dc.contributor.authorWang, SCen_US
dc.date.accessioned2014-12-08T15:36:25Z-
dc.date.available2014-12-08T15:36:25Z-
dc.date.issued2005en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://hdl.handle.net/11536/24746-
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.44.L901en_US
dc.description.abstractIn this paper, we employed a high bandgap Al0.75Ga0.25As layer acting as an electronic blocking layer in the upper In0.15Al0.08Ga0.77As/Al0.3Ga0.7As active region before the growth of p-type layers of 850-nm vertical-cavity surface-emitting lasers (VCSELs). A threshold current of 1.33mA and slope efficiency of 0.53W/A at 25 degrees C were obtained, and the temperature dependent light output and voltage versus current (L-I-V) characteristics showed that the VCSELs with a high bandgap Al0.75Ga0.25As layer were more stable when the substrate temperature was in a range of 25-95 degrees C. The threshold current increased with temperature up to 95 degrees C was less than 21% and the slope efficiency dropped only 24.5%.en_US
dc.language.isoen_USen_US
dc.subject850nmen_US
dc.subjectVCSELen_US
dc.subjectleakage currenten_US
dc.subjectcurrent blocking layeren_US
dc.titleHigh temperature stability 850-nm In0.15Al0.08Ga0.77As/Al0.3Ga0.7As vertical-cavity surface-emitting laser with single Al0.75Ga0.25As current blocking layeren_US
dc.typeArticleen_US
dc.identifier.doi10.1143/JJAP.44.L901en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERSen_US
dc.citation.volume44en_US
dc.citation.issue28-32en_US
dc.citation.spageL901en_US
dc.citation.epageL902en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000231426100004-
dc.citation.woscount2-
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