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dc.contributor.authorYen, Li-Chenen_US
dc.contributor.authorTang, Ming-Tsyren_US
dc.contributor.authorChang, Fang-Yuen_US
dc.contributor.authorPan, Tung-Mingen_US
dc.contributor.authorChao, Tien-Shengen_US
dc.contributor.authorLee, Chiang-Hsuanen_US
dc.date.accessioned2014-12-08T15:36:25Z-
dc.date.available2014-12-08T15:36:25Z-
dc.date.issued2014-03-01en_US
dc.identifier.issn1424-8220en_US
dc.identifier.urihttp://dx.doi.org/10.3390/s140303825en_US
dc.identifier.urihttp://hdl.handle.net/11536/24760-
dc.description.abstractIn this article, we report an improvement in the pH sensitivity of low-temperature polycrystalline-silicon (poly-Si) thin-film transistor (TFT) sensors using an H-2 sintering process. The low-temperature polycrystalline-silicon (LTPS) TFT sensor with H-2 sintering exhibited a high sensitivity than that without H-2 sintering. This result may be due to the resulting increase in the number of Si-OH2+ and Si-O- bonds due to the incorporation of H in the gate oxide to reduce the dangling silicon bonds and hence create the surface active sites and the resulting increase in the number of chemical reactions at these surface active sites. Moreover, the LTPS TFT sensor device not only offers low cost and a simple fabrication processes, but the technique also can be extended to integrate the sensor into other systems.en_US
dc.language.isoen_USen_US
dc.subjectlow-temperature polycrystalline-silicon (poly-Si)en_US
dc.subjectthin-film transistors (TFTs)en_US
dc.subjectH-2 sinteringen_US
dc.subjectpH sensitivityen_US
dc.titleImprovement in pH Sensitivity of Low-Temperature Polycrystalline-Silicon Thin-Film Transistor Sensors Using H-2 Sinteringen_US
dc.typeArticleen_US
dc.identifier.doi10.3390/s140303825en_US
dc.identifier.journalSENSORSen_US
dc.citation.volume14en_US
dc.citation.issue3en_US
dc.citation.spage3825en_US
dc.citation.epage3832en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000336783300001-
dc.citation.woscount0-
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