标题: Low Leakage Current GaN MIS-HEMT with SiNx Gate Insulator using N-2 Plasma Treatment
作者: Liu, S. C.
Wang, H. C.
Chang, E. Y.
材料科学与工程学系
Department of Materials Science and Engineering
公开日期: 2013
摘要: In this work, an effective N-2 plasma treatment for suppressing leakage current in GaN MIS-HEMT has been demonstrated. We observed an important issue of leakage current from the SiNx/GaN interface. To investigate the leakage current mechanisms, we measured the leakage current from all the possible paths in the device structure, such as gate, mesa isolation, and drain leakage. The current-voltage measurement results reveal a severe leakage path at the SiNx/GaN interface after SiNx deposited on the GaN surface without N-2 plasma treatment. By using N-2 plasma treatment, we succeed in suppressing the leakage current and effectively improve breakdown voltage. A significant performance improvement of GaN MIS-HEMT with very low leakage current has been achieved through the N-2 plasma treatment.
URI: http://hdl.handle.net/11536/24785
http://dx.doi.org/10.1149/05302.0061ecst
ISBN: 978-1-60768-375-9; 978-1-62332-024-9
ISSN: 1938-5862
DOI: 10.1149/05302.0061ecst
期刊: WIDE-BANDGAP SEMICONDUCTOR MATERIALS AND DEVICES 14
Volume: 53
Issue: 2
起始页: 61
结束页: 63
显示于类别:Conferences Paper


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