Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | CHEN, HD | en_US |
dc.contributor.author | FENG, MS | en_US |
dc.contributor.author | LIN, KC | en_US |
dc.contributor.author | CHEN, PA | en_US |
dc.contributor.author | WU, CC | en_US |
dc.contributor.author | WU, JW | en_US |
dc.date.accessioned | 2014-12-08T15:03:58Z | - |
dc.date.available | 2014-12-08T15:03:58Z | - |
dc.date.issued | 1994-05-15 | en_US |
dc.identifier.issn | 0021-8979 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.355706 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/2488 | - |
dc.description.abstract | An anomalous mobility enhancement and metallic-type conductivity were observed in heavily carbon-doped GaAs grown by low-pressure metalorganic chemical vapor deposition. The 77 K mobility was slightly lower than that of 300 K for hole concentration between 1 x 10(18) and 4 x 10(18) cm-3. However, the 77 K mobility was enhanced from p > 4 X 10(18) cm-3, and the 300 K mobility slowly decreased with increasing hole concentration that ranged from 7 X 10(18) to 3 X 10(19) cm -3. As a result, the 77 K mobility was around 50%-60% greater than the 300 K mobility due to the metallic-type conductivity. | en_US |
dc.language.iso | en_US | en_US |
dc.title | ANOMALOUS MOBILITY ENHANCEMENT IN HEAVILY CARBON-DOPED GAAS | en_US |
dc.type | Note | en_US |
dc.identifier.doi | 10.1063/1.355706 | en_US |
dc.identifier.journal | JOURNAL OF APPLIED PHYSICS | en_US |
dc.citation.volume | 75 | en_US |
dc.citation.issue | 10 | en_US |
dc.citation.spage | 5453 | en_US |
dc.citation.epage | 5455 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | 電控工程研究所 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
dc.identifier.wosnumber | WOS:A1994NN73200097 | - |
dc.citation.woscount | 5 | - |
Appears in Collections: | Articles |